[v3,00/12] gpio: rockchip: Update the GPIO driver

Message

Ye Zhang Sept. 3, 2024, 7:36 a.m. UTC

GPIO driver support acpi and new version, set input direction in
irq_request_resources, fix division error and debounce config error.

Changes since v1:
- Split commits with multiple changes into separate commits.
- Adjust backportable fix to the forefront.
- Modify messages of some commits.

Changes since v2:
- Optimize version number comments.
- Modify the GPIO version judgment logic.
- Use devm_clk_get_enabled to simplify the code.
- Use guard instead of mutex_lock to simplify the code.
- Use irq_hw_number_t and irqd_to_hwirq() in the request irq function.
- Since list_first_entry cannot return NULL, remove the NULL check.
- Temporarily do not add support for ACPI.

Ye Zhang (12):
  gpio: rockchip: avoid division by zero
  gpio: rockchip: release reference to device node
  gpio: rockchip: resolve overflow issues
  gpio: rockchip: resolve underflow issue
  gpio: rockchip: fix debounce calculate
  gpio: rockchip: Update debounce config function
  gpio: rockchip: support 'clock-names' from dt nodes
  gpio: rockchip: explan the format of the GPIO version ID
  gpio: rockchip: change the GPIO version judgment logic
  gpio: rockchip: support new version gpio
  gpio: rockchip: Set input direction when request irq
  gpio: rockchip: replace mutex_lock() with guard()

 drivers/gpio/gpio-rockchip.c       | 151 ++++++++++++++++++-----------
 drivers/pinctrl/pinctrl-rockchip.h |   2 +
 2 files changed, 99 insertions(+), 54 deletions(-)

Comments

Andy Shevchenko Sept. 3, 2024, 4 p.m. UTC | #1

On Tue, Sep 03, 2024 at 03:36:37PM +0800, Ye Zhang wrote:
> GPIO driver support acpi and new version, set input direction in
> irq_request_resources, fix division error and debounce config error.

Looking at patch 7 it seems the new feature has been barely tested.
First of all, I recommend to split out the real fixes for now and send them
separately while working on the rest. Second, perform better bisectability
(both compile and run time) and overall test coverage in different scenarios.