| Message ID | 20190221091527.20497-12-miquel.raynal@bootlin.com (mailing list archive) |
|---|---|
| State | New, archived |
| Headers | show |
| Series | mtd: rawnand: 5th batch of cleanups | expand |
On 21.02.19 10:15, Miquel Raynal wrote: > From: Boris Brezillon <bbrezillon@kernel.org> > > nanddev_mtd_max_bad_blocks() is implemented by the generic NAND layer > and is already doing what we need. Reuse this function instead of > having our own implementation. > > While at it, get rid of the ->max_bb_per_die and ->blocks_per_die > fields which are now unused. > > Signed-off-by: Boris Brezillon <bbrezillon@kernel.org> > Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com> Reviewed-by: Frieder Schrempf <frieder.schrempf@kontron.de> > --- > drivers/mtd/nand/raw/nand_base.c | 38 +------------------------------- > drivers/mtd/nand/raw/nand_onfi.c | 3 --- > include/linux/mtd/rawnand.h | 5 ----- > 3 files changed, 1 insertion(+), 45 deletions(-) > > diff --git a/drivers/mtd/nand/raw/nand_base.c b/drivers/mtd/nand/raw/nand_base.c > index 256d16903d54..4c9c2660df64 100644 > --- a/drivers/mtd/nand/raw/nand_base.c > +++ b/drivers/mtd/nand/raw/nand_base.c > @@ -4350,42 +4350,6 @@ static int nand_block_markbad(struct mtd_info *mtd, loff_t ofs) > return nand_block_markbad_lowlevel(mtd_to_nand(mtd), ofs); > } > > -/** > - * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd > - * @mtd: MTD device structure > - * @ofs: offset relative to mtd start > - * @len: length of mtd > - */ > -static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len) > -{ > - struct nand_chip *chip = mtd_to_nand(mtd); > - u32 part_start_block; > - u32 part_end_block; > - u32 part_start_die; > - u32 part_end_die; > - > - /* > - * max_bb_per_die and blocks_per_die used to determine > - * the maximum bad block count. > - */ > - if (!chip->max_bb_per_die || !chip->blocks_per_die) > - return -ENOTSUPP; > - > - /* Get the start and end of the partition in erase blocks. */ > - part_start_block = mtd_div_by_eb(ofs, mtd); > - part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1; > - > - /* Get the start and end LUNs of the partition. */ > - part_start_die = part_start_block / chip->blocks_per_die; > - part_end_die = part_end_block / chip->blocks_per_die; > - > - /* > - * Look up the bad blocks per unit and multiply by the number of units > - * that the partition spans. > - */ > - return chip->max_bb_per_die * (part_end_die - part_start_die + 1); > -} > - > /** > * nand_suspend - [MTD Interface] Suspend the NAND flash > * @mtd: MTD device structure > @@ -5854,7 +5818,7 @@ static int nand_scan_tail(struct nand_chip *chip) > mtd->_block_isreserved = nand_block_isreserved; > mtd->_block_isbad = nand_block_isbad; > mtd->_block_markbad = nand_block_markbad; > - mtd->_max_bad_blocks = nand_max_bad_blocks; > + mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks; > > /* > * Initialize bitflip_threshold to its default prior scan_bbt() call. > diff --git a/drivers/mtd/nand/raw/nand_onfi.c b/drivers/mtd/nand/raw/nand_onfi.c > index f3f59cf37d7f..3ca9c8923a30 100644 > --- a/drivers/mtd/nand/raw/nand_onfi.c > +++ b/drivers/mtd/nand/raw/nand_onfi.c > @@ -251,9 +251,6 @@ int nand_onfi_detect(struct nand_chip *chip) > memorg->bits_per_cell = p->bits_per_cell; > chip->bits_per_cell = p->bits_per_cell; > > - chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun); > - chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun); > - > if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS) > chip->options |= NAND_BUSWIDTH_16; > > diff --git a/include/linux/mtd/rawnand.h b/include/linux/mtd/rawnand.h > index 00a8795b215d..d748e09de480 100644 > --- a/include/linux/mtd/rawnand.h > +++ b/include/linux/mtd/rawnand.h > @@ -1027,9 +1027,6 @@ struct nand_legacy { > * @id: [INTERN] holds NAND ID > * @parameters: [INTERN] holds generic parameters under an easily > * readable form. > - * @max_bb_per_die: [INTERN] the max number of bad blocks each die of a > - * this nand device will encounter their life times. > - * @blocks_per_die: [INTERN] The number of PEBs in a die > * @data_interface: [INTERN] NAND interface timing information > * @cur_cs: currently selected target. -1 means no target selected, > * otherwise we should always have cur_cs >= 0 && > @@ -1085,8 +1082,6 @@ struct nand_chip { > > struct nand_id id; > struct nand_parameters parameters; > - u16 max_bb_per_die; > - u32 blocks_per_die; > > struct nand_data_interface data_interface; > >
diff --git a/drivers/mtd/nand/raw/nand_base.c b/drivers/mtd/nand/raw/nand_base.c index 256d16903d54..4c9c2660df64 100644 --- a/drivers/mtd/nand/raw/nand_base.c +++ b/drivers/mtd/nand/raw/nand_base.c @@ -4350,42 +4350,6 @@ static int nand_block_markbad(struct mtd_info *mtd, loff_t ofs) return nand_block_markbad_lowlevel(mtd_to_nand(mtd), ofs); } -/** - * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd - * @mtd: MTD device structure - * @ofs: offset relative to mtd start - * @len: length of mtd - */ -static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len) -{ - struct nand_chip *chip = mtd_to_nand(mtd); - u32 part_start_block; - u32 part_end_block; - u32 part_start_die; - u32 part_end_die; - - /* - * max_bb_per_die and blocks_per_die used to determine - * the maximum bad block count. - */ - if (!chip->max_bb_per_die || !chip->blocks_per_die) - return -ENOTSUPP; - - /* Get the start and end of the partition in erase blocks. */ - part_start_block = mtd_div_by_eb(ofs, mtd); - part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1; - - /* Get the start and end LUNs of the partition. */ - part_start_die = part_start_block / chip->blocks_per_die; - part_end_die = part_end_block / chip->blocks_per_die; - - /* - * Look up the bad blocks per unit and multiply by the number of units - * that the partition spans. - */ - return chip->max_bb_per_die * (part_end_die - part_start_die + 1); -} - /** * nand_suspend - [MTD Interface] Suspend the NAND flash * @mtd: MTD device structure @@ -5854,7 +5818,7 @@ static int nand_scan_tail(struct nand_chip *chip) mtd->_block_isreserved = nand_block_isreserved; mtd->_block_isbad = nand_block_isbad; mtd->_block_markbad = nand_block_markbad; - mtd->_max_bad_blocks = nand_max_bad_blocks; + mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks; /* * Initialize bitflip_threshold to its default prior scan_bbt() call. diff --git a/drivers/mtd/nand/raw/nand_onfi.c b/drivers/mtd/nand/raw/nand_onfi.c index f3f59cf37d7f..3ca9c8923a30 100644 --- a/drivers/mtd/nand/raw/nand_onfi.c +++ b/drivers/mtd/nand/raw/nand_onfi.c @@ -251,9 +251,6 @@ int nand_onfi_detect(struct nand_chip *chip) memorg->bits_per_cell = p->bits_per_cell; chip->bits_per_cell = p->bits_per_cell; - chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun); - chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun); - if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS) chip->options |= NAND_BUSWIDTH_16; diff --git a/include/linux/mtd/rawnand.h b/include/linux/mtd/rawnand.h index 00a8795b215d..d748e09de480 100644 --- a/include/linux/mtd/rawnand.h +++ b/include/linux/mtd/rawnand.h @@ -1027,9 +1027,6 @@ struct nand_legacy { * @id: [INTERN] holds NAND ID * @parameters: [INTERN] holds generic parameters under an easily * readable form. - * @max_bb_per_die: [INTERN] the max number of bad blocks each die of a - * this nand device will encounter their life times. - * @blocks_per_die: [INTERN] The number of PEBs in a die * @data_interface: [INTERN] NAND interface timing information * @cur_cs: currently selected target. -1 means no target selected, * otherwise we should always have cur_cs >= 0 && @@ -1085,8 +1082,6 @@ struct nand_chip { struct nand_id id; struct nand_parameters parameters; - u16 max_bb_per_die; - u32 blocks_per_die; struct nand_data_interface data_interface;