Message ID | 20220626122938.582107-3-jic23@kernel.org (mailing list archive) |
---|---|
State | Accepted |
Headers | show |
Series | [v3,01/17] iio: core: Increase precision of IIO_VAL_FRACTIONAL_LOG2 when possible | expand |
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 3e00d7f7ee22..d3a0c0ef8948 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -193,7 +193,7 @@ Description: Raw capacitance measurement from channel Y. Units after application of scale and offset are nanofarads. -What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +What: /sys/.../iio:deviceX/in_capacitanceY-capacitanceZ_raw KernelVersion: 3.2 Contact: linux-iio@vger.kernel.org Description: