| Message ID | 20220626165511.602202-2-jic23@kernel.org (mailing list archive) |
|---|---|
| State | Accepted |
| Headers | show |
| Series | IIO: Some documentation error and warning fixes. | expand |
Em Sun, 26 Jun 2022 17:55:08 +0100 Jonathan Cameron <jic23@kernel.org> escreveu: > From: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > The kernel build docs do not support having multiple definitions for > the same sysfs filename. Actually, this is not a matter of the docs build system not supporting. It is, instead, how the ABI were supposed to work: a given ABI symbol should have consistent behavior on all drivers that use it. Failing to do that is asking for troubles. So, having duplicated symbols either mean that: a) both have the same meaning. They can/should be unified in order to remove redundant documentation; b) the same ABI symbol have different meanings depending on the driver(s) that use it. This makes very hard for userspace, as it is harder to write a program using it, as the behavior/meaning starts to be driver-dependent. > Hence generalize the documentation a little > and pull it out of device specific files and into > sysfs-bus-iio-thermocouple > > These may well be more general and need pulling into a more generic > file in the future, but we can do that when it is needed. > > Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> > Cc: Navin Sankar Velliangiri <navin@linumiz.com> > Cc: Paresh Chaudhary <paresh.chaudhary@rockwellcollins.com> Except for the above correction, the patch looks OK to me. Reviewed-by: Mauro Carvalho Chehab <mchehab@kernel.org> > --- > .../sysfs-bus-iio-temperature-max31856 | 31 ------------------- > .../sysfs-bus-iio-temperature-max31865 | 12 ------- > .../ABI/testing/sysfs-bus-iio-thermocouple | 18 +++++++++++ > 3 files changed, 18 insertions(+), 43 deletions(-) > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > deleted file mode 100644 > index e5ef6d8e5da1..000000000000 > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > +++ /dev/null > @@ -1,31 +0,0 @@ > -What: /sys/bus/iio/devices/iio:deviceX/fault_oc > -KernelVersion: 5.1 > -Contact: linux-iio@vger.kernel.org > -Description: > - Open-circuit fault. The detection of open-circuit faults, > - such as those caused by broken thermocouple wires. > - Reading returns either '1' or '0'. > - > - === ======================================================= > - '1' An open circuit such as broken thermocouple wires > - has been detected. > - '0' No open circuit or broken thermocouple wires are detected > - === ======================================================= > - > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > -KernelVersion: 5.1 > -Contact: linux-iio@vger.kernel.org > -Description: > - Overvoltage or Undervoltage Input Fault. The internal circuitry > - is protected from excessive voltages applied to the thermocouple > - cables by integrated MOSFETs at the T+ and T- inputs, and the > - BIAS output. These MOSFETs turn off when the input voltage is > - negative or greater than VDD. > - > - Reading returns either '1' or '0'. > - > - === ======================================================= > - '1' The input voltage is negative or greater than VDD. > - '0' The input voltage is positive and less than VDD (normal > - state). > - === ======================================================= > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > index 4b072da92218..349089e4f2d6 100644 > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > +++ b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > @@ -1,15 +1,3 @@ > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > -KernelVersion: 5.11 > -Contact: linux-iio@vger.kernel.org > -Description: > - Overvoltage or Undervoltage Input fault. The internal circuitry > - is protected from excessive voltages applied to the thermocouple > - cables at FORCE+, FORCE2, RTDIN+ & RTDIN-. This circuitry turn > - off when the input voltage is negative or greater than VDD. > - > - Reading returns '1' if input voltage is negative or greater > - than VDD, otherwise '0'. > - > What: /sys/bus/iio/devices/iio:deviceX/in_filter_notch_center_frequency > KernelVersion: 5.11 > Contact: linux-iio@vger.kernel.org > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-thermocouple b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > new file mode 100644 > index 000000000000..01259df297ca > --- /dev/null > +++ b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > @@ -0,0 +1,18 @@ > +What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > +KernelVersion: 5.1 > +Contact: linux-iio@vger.kernel.org > +Description: > + Overvoltage or Undervoltage Input Fault. The internal circuitry > + is protected from excessive voltages applied to the thermocouple > + cables. The device can also detect if such a condition occurs. > + > + Reading returns '1' if input voltage is negative or greater > + than VDD, otherwise '0'. > + > +What: /sys/bus/iio/devices/iio:deviceX/fault_oc > +KernelVersion: 5.1 > +Contact: linux-iio@vger.kernel.org > +Description: > + Open-circuit fault. The detection of open-circuit faults, > + such as those caused by broken thermocouple wires. > + Reading returns '1' if fault, '0' otherwise.
On Sun, 26 Jun 2022 23:33:31 +0100 Mauro Carvalho Chehab <mchehab@kernel.org> wrote: > Em Sun, 26 Jun 2022 17:55:08 +0100 > Jonathan Cameron <jic23@kernel.org> escreveu: > > > From: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > > > The kernel build docs do not support having multiple definitions for > > the same sysfs filename. > > Actually, this is not a matter of the docs build system not supporting. > It is, instead, how the ABI were supposed to work: a given ABI symbol > should have consistent behavior on all drivers that use it. Failing to > do that is asking for troubles. > > So, having duplicated symbols either mean that: > > a) both have the same meaning. They can/should be unified in order to > remove redundant documentation; > > b) the same ABI symbol have different meanings depending on the driver(s) > that use it. This makes very hard for userspace, as it is harder to > write a program using it, as the behavior/meaning starts to be > driver-dependent. I think we'll disagree on this. There are circumstances where a particular ABI in a particular driver benefits from additional documentation that would be in the 'impdef category' for the generic ABI. For this particular case it extends the info available from 'wire disconnected' in the generic case, to 'which possible wires are disconnected' in the specific case. Neither affects what userspace does with it, but they are useful if you are debugging the hardware. They are probably not worth expanding the ABI to provide a debugging guide, so it that info was in the documentation but is now lost (in this case, non critical as it's probably a case of go read the datasheet if the hanging wire isn't obvious). I don't mind just making this patch description vague: Kernel documentation for a given ABI element should not be duplicated in multiple files, so pull them into one higher level documentation file. > > > > Hence generalize the documentation a little > > and pull it out of device specific files and into > > sysfs-bus-iio-thermocouple > > > > These may well be more general and need pulling into a more generic > > file in the future, but we can do that when it is needed. > > > > Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > Cc: Navin Sankar Velliangiri <navin@linumiz.com> > > Cc: Paresh Chaudhary <paresh.chaudhary@rockwellcollins.com> > > Except for the above correction, the patch looks OK to me. > > Reviewed-by: Mauro Carvalho Chehab <mchehab@kernel.org> > > > --- > > .../sysfs-bus-iio-temperature-max31856 | 31 ------------------- > > .../sysfs-bus-iio-temperature-max31865 | 12 ------- > > .../ABI/testing/sysfs-bus-iio-thermocouple | 18 +++++++++++ > > 3 files changed, 18 insertions(+), 43 deletions(-) > > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > > deleted file mode 100644 > > index e5ef6d8e5da1..000000000000 > > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > > +++ /dev/null > > @@ -1,31 +0,0 @@ > > -What: /sys/bus/iio/devices/iio:deviceX/fault_oc > > -KernelVersion: 5.1 > > -Contact: linux-iio@vger.kernel.org > > -Description: > > - Open-circuit fault. The detection of open-circuit faults, > > - such as those caused by broken thermocouple wires. > > - Reading returns either '1' or '0'. > > - > > - === ======================================================= > > - '1' An open circuit such as broken thermocouple wires > > - has been detected. > > - '0' No open circuit or broken thermocouple wires are detected > > - === ======================================================= > > - > > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > -KernelVersion: 5.1 > > -Contact: linux-iio@vger.kernel.org > > -Description: > > - Overvoltage or Undervoltage Input Fault. The internal circuitry > > - is protected from excessive voltages applied to the thermocouple > > - cables by integrated MOSFETs at the T+ and T- inputs, and the > > - BIAS output. These MOSFETs turn off when the input voltage is > > - negative or greater than VDD. > > - > > - Reading returns either '1' or '0'. > > - > > - === ======================================================= > > - '1' The input voltage is negative or greater than VDD. > > - '0' The input voltage is positive and less than VDD (normal > > - state). > > - === ======================================================= > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > index 4b072da92218..349089e4f2d6 100644 > > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > +++ b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > @@ -1,15 +1,3 @@ > > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > -KernelVersion: 5.11 > > -Contact: linux-iio@vger.kernel.org > > -Description: > > - Overvoltage or Undervoltage Input fault. The internal circuitry > > - is protected from excessive voltages applied to the thermocouple > > - cables at FORCE+, FORCE2, RTDIN+ & RTDIN-. This circuitry turn > > - off when the input voltage is negative or greater than VDD. > > - > > - Reading returns '1' if input voltage is negative or greater > > - than VDD, otherwise '0'. > > - > > What: /sys/bus/iio/devices/iio:deviceX/in_filter_notch_center_frequency > > KernelVersion: 5.11 > > Contact: linux-iio@vger.kernel.org > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-thermocouple b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > > new file mode 100644 > > index 000000000000..01259df297ca > > --- /dev/null > > +++ b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > > @@ -0,0 +1,18 @@ > > +What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > +KernelVersion: 5.1 > > +Contact: linux-iio@vger.kernel.org > > +Description: > > + Overvoltage or Undervoltage Input Fault. The internal circuitry > > + is protected from excessive voltages applied to the thermocouple > > + cables. The device can also detect if such a condition occurs. > > + > > + Reading returns '1' if input voltage is negative or greater > > + than VDD, otherwise '0'. > > + > > +What: /sys/bus/iio/devices/iio:deviceX/fault_oc > > +KernelVersion: 5.1 > > +Contact: linux-iio@vger.kernel.org > > +Description: > > + Open-circuit fault. The detection of open-circuit faults, > > + such as those caused by broken thermocouple wires. > > + Reading returns '1' if fault, '0' otherwise.
Em Mon, 27 Jun 2022 15:18:12 +0100 Jonathan Cameron <Jonathan.Cameron@Huawei.com> escreveu: > On Sun, 26 Jun 2022 23:33:31 +0100 > Mauro Carvalho Chehab <mchehab@kernel.org> wrote: > > > Em Sun, 26 Jun 2022 17:55:08 +0100 > > Jonathan Cameron <jic23@kernel.org> escreveu: > > > > > From: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > > > > > The kernel build docs do not support having multiple definitions for > > > the same sysfs filename. > > > > Actually, this is not a matter of the docs build system not supporting. > > It is, instead, how the ABI were supposed to work: a given ABI symbol > > should have consistent behavior on all drivers that use it. Failing to > > do that is asking for troubles. > > > > So, having duplicated symbols either mean that: > > > > a) both have the same meaning. They can/should be unified in order to > > remove redundant documentation; > > > > b) the same ABI symbol have different meanings depending on the driver(s) > > that use it. This makes very hard for userspace, as it is harder to > > write a program using it, as the behavior/meaning starts to be > > driver-dependent. > > I think we'll disagree on this. > > There are circumstances where a particular ABI in a particular driver > benefits from additional documentation that would be in the 'impdef > category' for the generic ABI. If a particular driver needs something different, either: 1. the ABI definition was loose or too tight, not being generic enough to cover other hardware needing ABI for the same feature; 2. a different ABI symbol would need, as the two symbols with the same name are mapping completely different ABIs. > For this particular case it extends the info available from 'wire > disconnected' in the generic case, to 'which possible wires are > disconnected' in the specific case. In the specific case of device faults, it could be mapped in a way that would be generic enough, yet providing hardware-specific information, when the hardware supports it. In this specific case, I would probably create a generic ABI (or ABI set) to report hardware issues in a way that it would be more generic. One possibility for this case would be to use something like this: $ cat /sys/bus/iio/devices/iio:deviceX/fault no faults On hardware that can't pinpoint what wire(s) the problem is occurring: $ cat /sys/bus/iio/devices/iio:deviceX/fault fault: open circuit or $ cat /sys/bus/iio/devices/iio:deviceX/fault fault: excessive voltage On more sophisticated hardware that can pinpoint what wires have issues, it may report, instead: $ cat /sys/bus/iio/devices/iio:deviceX/fault fault: open circuit fault at thermocouple wire #2 or $ cat /sys/bus/iio/devices/iio:deviceX/fault fault: excessive voltage at thermocouple wires #0 and #1 or even: $ cat /sys/bus/iio/devices/iio:deviceX/fault fault: open circuit fault at thermocouple wire #2 fault: excessive voltage at thermocouple wires #0 and #1 The above should be generic enough for a program to identify if there isn't any failures if such "fault" ABI would return "no faults". Any value different than that means that there's a fault, and the read value telling what happened could be output to the user before such program aborts due to a hardware error. - The point is that, when the ABI is made to be subsystem-wide since the beginning, it tends to be more generic, as the ABI design should consider that other devices may have different capabilities. > Neither affects what userspace > does with it, but they are useful if you are debugging the hardware. > They are probably not worth expanding the ABI to provide a debugging > guide, so it that info was in the documentation but is now lost > (in this case, non critical as it's probably a case of go read the > datasheet if the hanging wire isn't obvious). > > I don't mind just making this patch description vague: > > Kernel documentation for a given ABI element should not be duplicated > in multiple files, so pull them into one higher level documentation file. Works for me. With that, feel free to add my reviewed-by. Regards, Mauro > > > Hence generalize the documentation a little > > > and pull it out of device specific files and into > > > sysfs-bus-iio-thermocouple > > > > > > These may well be more general and need pulling into a more generic > > > file in the future, but we can do that when it is needed. > > > > > > Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > > Cc: Navin Sankar Velliangiri <navin@linumiz.com> > > > Cc: Paresh Chaudhary <paresh.chaudhary@rockwellcollins.com> > > > > Except for the above correction, the patch looks OK to me. > > > > Reviewed-by: Mauro Carvalho Chehab <mchehab@kernel.org> > > > > > --- > > > .../sysfs-bus-iio-temperature-max31856 | 31 ------------------- > > > .../sysfs-bus-iio-temperature-max31865 | 12 ------- > > > .../ABI/testing/sysfs-bus-iio-thermocouple | 18 +++++++++++ > > > 3 files changed, 18 insertions(+), 43 deletions(-) > > > > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > > > deleted file mode 100644 > > > index e5ef6d8e5da1..000000000000 > > > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > > > +++ /dev/null > > > @@ -1,31 +0,0 @@ > > > -What: /sys/bus/iio/devices/iio:deviceX/fault_oc > > > -KernelVersion: 5.1 > > > -Contact: linux-iio@vger.kernel.org > > > -Description: > > > - Open-circuit fault. The detection of open-circuit faults, > > > - such as those caused by broken thermocouple wires. > > > - Reading returns either '1' or '0'. > > > - > > > - === ======================================================= > > > - '1' An open circuit such as broken thermocouple wires > > > - has been detected. > > > - '0' No open circuit or broken thermocouple wires are detected > > > - === ======================================================= > > > - > > > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > > -KernelVersion: 5.1 > > > -Contact: linux-iio@vger.kernel.org > > > -Description: > > > - Overvoltage or Undervoltage Input Fault. The internal circuitry > > > - is protected from excessive voltages applied to the thermocouple > > > - cables by integrated MOSFETs at the T+ and T- inputs, and the > > > - BIAS output. These MOSFETs turn off when the input voltage is > > > - negative or greater than VDD. > > > - > > > - Reading returns either '1' or '0'. > > > - > > > - === ======================================================= > > > - '1' The input voltage is negative or greater than VDD. > > > - '0' The input voltage is positive and less than VDD (normal > > > - state). > > > - === ======================================================= > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > > index 4b072da92218..349089e4f2d6 100644 > > > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > > +++ b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > > @@ -1,15 +1,3 @@ > > > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > > -KernelVersion: 5.11 > > > -Contact: linux-iio@vger.kernel.org > > > -Description: > > > - Overvoltage or Undervoltage Input fault. The internal circuitry > > > - is protected from excessive voltages applied to the thermocouple > > > - cables at FORCE+, FORCE2, RTDIN+ & RTDIN-. This circuitry turn > > > - off when the input voltage is negative or greater than VDD. > > > - > > > - Reading returns '1' if input voltage is negative or greater > > > - than VDD, otherwise '0'. > > > - > > > What: /sys/bus/iio/devices/iio:deviceX/in_filter_notch_center_frequency > > > KernelVersion: 5.11 > > > Contact: linux-iio@vger.kernel.org > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-thermocouple b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > > > new file mode 100644 > > > index 000000000000..01259df297ca > > > --- /dev/null > > > +++ b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > > > @@ -0,0 +1,18 @@ > > > +What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > > +KernelVersion: 5.1 > > > +Contact: linux-iio@vger.kernel.org > > > +Description: > > > + Overvoltage or Undervoltage Input Fault. The internal circuitry > > > + is protected from excessive voltages applied to the thermocouple > > > + cables. The device can also detect if such a condition occurs. > > > + > > > + Reading returns '1' if input voltage is negative or greater > > > + than VDD, otherwise '0'. > > > + > > > +What: /sys/bus/iio/devices/iio:deviceX/fault_oc > > > +KernelVersion: 5.1 > > > +Contact: linux-iio@vger.kernel.org > > > +Description: > > > + Open-circuit fault. The detection of open-circuit faults, > > > + such as those caused by broken thermocouple wires. > > > + Reading returns '1' if fault, '0' otherwise. >
On Tue, 28 Jun 2022 07:44:09 +0100 Mauro Carvalho Chehab <mchehab@kernel.org> wrote: > Em Mon, 27 Jun 2022 15:18:12 +0100 > Jonathan Cameron <Jonathan.Cameron@Huawei.com> escreveu: > > > On Sun, 26 Jun 2022 23:33:31 +0100 > > Mauro Carvalho Chehab <mchehab@kernel.org> wrote: > > > > > Em Sun, 26 Jun 2022 17:55:08 +0100 > > > Jonathan Cameron <jic23@kernel.org> escreveu: > > > > > > > From: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > > > > > > > The kernel build docs do not support having multiple definitions for > > > > the same sysfs filename. > > > > > > Actually, this is not a matter of the docs build system not supporting. > > > It is, instead, how the ABI were supposed to work: a given ABI symbol > > > should have consistent behavior on all drivers that use it. Failing to > > > do that is asking for troubles. > > > > > > So, having duplicated symbols either mean that: > > > > > > a) both have the same meaning. They can/should be unified in order to > > > remove redundant documentation; > > > > > > b) the same ABI symbol have different meanings depending on the driver(s) > > > that use it. This makes very hard for userspace, as it is harder to > > > write a program using it, as the behavior/meaning starts to be > > > driver-dependent. > > > > I think we'll disagree on this. > > > > There are circumstances where a particular ABI in a particular driver > > benefits from additional documentation that would be in the 'impdef > > category' for the generic ABI. > > If a particular driver needs something different, either: > > 1. the ABI definition was loose or too tight, not being generic enough to > cover other hardware needing ABI for the same feature; > 2. a different ABI symbol would need, as the two symbols with the same > name are mapping completely different ABIs. > > > For this particular case it extends the info available from 'wire > > disconnected' in the generic case, to 'which possible wires are > > disconnected' in the specific case. > > In the specific case of device faults, it could be mapped in a way > that would be generic enough, yet providing hardware-specific information, > when the hardware supports it. > > In this specific case, I would probably create a generic ABI (or ABI set) > to report hardware issues in a way that it would be more generic. > > One possibility for this case would be to use something like this: > > $ cat /sys/bus/iio/devices/iio:deviceX/fault > no faults > > On hardware that can't pinpoint what wire(s) the problem is occurring: > > $ cat /sys/bus/iio/devices/iio:deviceX/fault > fault: open circuit > > or > $ cat /sys/bus/iio/devices/iio:deviceX/fault > fault: excessive voltage > > On more sophisticated hardware that can pinpoint what wires have > issues, it may report, instead: > > $ cat /sys/bus/iio/devices/iio:deviceX/fault > fault: open circuit fault at thermocouple wire #2 > > or > > $ cat /sys/bus/iio/devices/iio:deviceX/fault > fault: excessive voltage at thermocouple wires #0 and #1 > > or even: > > $ cat /sys/bus/iio/devices/iio:deviceX/fault > fault: open circuit fault at thermocouple wire #2 > fault: excessive voltage at thermocouple wires #0 and #1 > > The above should be generic enough for a program to identify if there > isn't any failures if such "fault" ABI would return "no faults". Any value > different than that means that there's a fault, and the read value > telling what happened could be output to the user before such program > aborts due to a hardware error. > > - > > The point is that, when the ABI is made to be subsystem-wide since > the beginning, it tends to be more generic, as the ABI design should > consider that other devices may have different capabilities. > > > Neither affects what userspace > > does with it, but they are useful if you are debugging the hardware. > > They are probably not worth expanding the ABI to provide a debugging > > guide, so it that info was in the documentation but is now lost > > (in this case, non critical as it's probably a case of go read the > > datasheet if the hanging wire isn't obvious). > > > > I don't mind just making this patch description vague: > > > > Kernel documentation for a given ABI element should not be duplicated > > in multiple files, so pull them into one higher level documentation file. > > Works for me. With that, feel free to add my reviewed-by. Applied - hopefully I'll sneak out a pull request later this week. Apologies for delay. I blame Covid. J > > Regards, > Mauro > > > > > Hence generalize the documentation a little > > > > and pull it out of device specific files and into > > > > sysfs-bus-iio-thermocouple > > > > > > > > These may well be more general and need pulling into a more generic > > > > file in the future, but we can do that when it is needed. > > > > > > > > Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com> > > > > Cc: Navin Sankar Velliangiri <navin@linumiz.com> > > > > Cc: Paresh Chaudhary <paresh.chaudhary@rockwellcollins.com> > > > > > > Except for the above correction, the patch looks OK to me. > > > > > > Reviewed-by: Mauro Carvalho Chehab <mchehab@kernel.org> > > > > > > > --- > > > > .../sysfs-bus-iio-temperature-max31856 | 31 ------------------- > > > > .../sysfs-bus-iio-temperature-max31865 | 12 ------- > > > > .../ABI/testing/sysfs-bus-iio-thermocouple | 18 +++++++++++ > > > > 3 files changed, 18 insertions(+), 43 deletions(-) > > > > > > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > > > > deleted file mode 100644 > > > > index e5ef6d8e5da1..000000000000 > > > > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 > > > > +++ /dev/null > > > > @@ -1,31 +0,0 @@ > > > > -What: /sys/bus/iio/devices/iio:deviceX/fault_oc > > > > -KernelVersion: 5.1 > > > > -Contact: linux-iio@vger.kernel.org > > > > -Description: > > > > - Open-circuit fault. The detection of open-circuit faults, > > > > - such as those caused by broken thermocouple wires. > > > > - Reading returns either '1' or '0'. > > > > - > > > > - === ======================================================= > > > > - '1' An open circuit such as broken thermocouple wires > > > > - has been detected. > > > > - '0' No open circuit or broken thermocouple wires are detected > > > > - === ======================================================= > > > > - > > > > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > > > -KernelVersion: 5.1 > > > > -Contact: linux-iio@vger.kernel.org > > > > -Description: > > > > - Overvoltage or Undervoltage Input Fault. The internal circuitry > > > > - is protected from excessive voltages applied to the thermocouple > > > > - cables by integrated MOSFETs at the T+ and T- inputs, and the > > > > - BIAS output. These MOSFETs turn off when the input voltage is > > > > - negative or greater than VDD. > > > > - > > > > - Reading returns either '1' or '0'. > > > > - > > > > - === ======================================================= > > > > - '1' The input voltage is negative or greater than VDD. > > > > - '0' The input voltage is positive and less than VDD (normal > > > > - state). > > > > - === ======================================================= > > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > > > index 4b072da92218..349089e4f2d6 100644 > > > > --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > > > +++ b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 > > > > @@ -1,15 +1,3 @@ > > > > -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > > > -KernelVersion: 5.11 > > > > -Contact: linux-iio@vger.kernel.org > > > > -Description: > > > > - Overvoltage or Undervoltage Input fault. The internal circuitry > > > > - is protected from excessive voltages applied to the thermocouple > > > > - cables at FORCE+, FORCE2, RTDIN+ & RTDIN-. This circuitry turn > > > > - off when the input voltage is negative or greater than VDD. > > > > - > > > > - Reading returns '1' if input voltage is negative or greater > > > > - than VDD, otherwise '0'. > > > > - > > > > What: /sys/bus/iio/devices/iio:deviceX/in_filter_notch_center_frequency > > > > KernelVersion: 5.11 > > > > Contact: linux-iio@vger.kernel.org > > > > diff --git a/Documentation/ABI/testing/sysfs-bus-iio-thermocouple b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > > > > new file mode 100644 > > > > index 000000000000..01259df297ca > > > > --- /dev/null > > > > +++ b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple > > > > @@ -0,0 +1,18 @@ > > > > +What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv > > > > +KernelVersion: 5.1 > > > > +Contact: linux-iio@vger.kernel.org > > > > +Description: > > > > + Overvoltage or Undervoltage Input Fault. The internal circuitry > > > > + is protected from excessive voltages applied to the thermocouple > > > > + cables. The device can also detect if such a condition occurs. > > > > + > > > > + Reading returns '1' if input voltage is negative or greater > > > > + than VDD, otherwise '0'. > > > > + > > > > +What: /sys/bus/iio/devices/iio:deviceX/fault_oc > > > > +KernelVersion: 5.1 > > > > +Contact: linux-iio@vger.kernel.org > > > > +Description: > > > > + Open-circuit fault. The detection of open-circuit faults, > > > > + such as those caused by broken thermocouple wires. > > > > + Reading returns '1' if fault, '0' otherwise. > >
diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 deleted file mode 100644 index e5ef6d8e5da1..000000000000 --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31856 +++ /dev/null @@ -1,31 +0,0 @@ -What: /sys/bus/iio/devices/iio:deviceX/fault_oc -KernelVersion: 5.1 -Contact: linux-iio@vger.kernel.org -Description: - Open-circuit fault. The detection of open-circuit faults, - such as those caused by broken thermocouple wires. - Reading returns either '1' or '0'. - - === ======================================================= - '1' An open circuit such as broken thermocouple wires - has been detected. - '0' No open circuit or broken thermocouple wires are detected - === ======================================================= - -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv -KernelVersion: 5.1 -Contact: linux-iio@vger.kernel.org -Description: - Overvoltage or Undervoltage Input Fault. The internal circuitry - is protected from excessive voltages applied to the thermocouple - cables by integrated MOSFETs at the T+ and T- inputs, and the - BIAS output. These MOSFETs turn off when the input voltage is - negative or greater than VDD. - - Reading returns either '1' or '0'. - - === ======================================================= - '1' The input voltage is negative or greater than VDD. - '0' The input voltage is positive and less than VDD (normal - state). - === ======================================================= diff --git a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 index 4b072da92218..349089e4f2d6 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 +++ b/Documentation/ABI/testing/sysfs-bus-iio-temperature-max31865 @@ -1,15 +1,3 @@ -What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv -KernelVersion: 5.11 -Contact: linux-iio@vger.kernel.org -Description: - Overvoltage or Undervoltage Input fault. The internal circuitry - is protected from excessive voltages applied to the thermocouple - cables at FORCE+, FORCE2, RTDIN+ & RTDIN-. This circuitry turn - off when the input voltage is negative or greater than VDD. - - Reading returns '1' if input voltage is negative or greater - than VDD, otherwise '0'. - What: /sys/bus/iio/devices/iio:deviceX/in_filter_notch_center_frequency KernelVersion: 5.11 Contact: linux-iio@vger.kernel.org diff --git a/Documentation/ABI/testing/sysfs-bus-iio-thermocouple b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple new file mode 100644 index 000000000000..01259df297ca --- /dev/null +++ b/Documentation/ABI/testing/sysfs-bus-iio-thermocouple @@ -0,0 +1,18 @@ +What: /sys/bus/iio/devices/iio:deviceX/fault_ovuv +KernelVersion: 5.1 +Contact: linux-iio@vger.kernel.org +Description: + Overvoltage or Undervoltage Input Fault. The internal circuitry + is protected from excessive voltages applied to the thermocouple + cables. The device can also detect if such a condition occurs. + + Reading returns '1' if input voltage is negative or greater + than VDD, otherwise '0'. + +What: /sys/bus/iio/devices/iio:deviceX/fault_oc +KernelVersion: 5.1 +Contact: linux-iio@vger.kernel.org +Description: + Open-circuit fault. The detection of open-circuit faults, + such as those caused by broken thermocouple wires. + Reading returns '1' if fault, '0' otherwise.