diff mbox series

[bpf-next,v3,15/17] selftests/bpf: add tests for hid_{get|set}_bits helpers

Message ID 20220318161528.1531164-16-benjamin.tissoires@redhat.com (mailing list archive)
State New
Headers show
Series Introduce eBPF support for HID devices | expand

Commit Message

Benjamin Tissoires March 18, 2022, 4:15 p.m. UTC
Simple test added here, with one use of each helper.

Signed-off-by: Benjamin Tissoires <benjamin.tissoires@redhat.com>

---

changes in v3:
- renamed hid_{get|set}_data into hid_{get|set}_bits

changes in v2:
- split the patch with libbpf left outside.
---
 tools/testing/selftests/bpf/prog_tests/hid.c | 59 ++++++++++++++++++++
 tools/testing/selftests/bpf/progs/hid.c      | 19 +++++++
 2 files changed, 78 insertions(+)
diff mbox series

Patch

diff --git a/tools/testing/selftests/bpf/prog_tests/hid.c b/tools/testing/selftests/bpf/prog_tests/hid.c
index edc3af71e9ed..e8aa1c6357e8 100644
--- a/tools/testing/selftests/bpf/prog_tests/hid.c
+++ b/tools/testing/selftests/bpf/prog_tests/hid.c
@@ -531,6 +531,62 @@  static int test_hid_user_call(struct hid *hid_skel, int uhid_fd, int sysfs_fd)
 	return ret;
 }
 
+/*
+ * Attach hid_set_get_bits to the given uhid device,
+ * retrieve and open the matching hidraw node,
+ * inject one event in the uhid device,
+ * check that the program makes correct use of bpf_hid_{set|get}_bits.
+ */
+static int test_hid_set_get_bits(struct hid *hid_skel, int uhid_fd, int sysfs_fd)
+{
+	int err, hidraw_ino, hidraw_fd = -1;
+	char hidraw_path[64] = {0};
+	u8 buf[10] = {0};
+	int ret = -1;
+
+	/* attach hid_set_get_bits program */
+	hid_skel->links.hid_set_get_bits =
+		bpf_program__attach_hid(hid_skel->progs.hid_set_get_bits, sysfs_fd, 0);
+	if (!ASSERT_OK_PTR(hid_skel->links.hid_set_get_bits,
+			   "attach_hid(hid_set_get_bits)"))
+		return PTR_ERR(hid_skel->links.hid_set_get_bits);
+
+	hidraw_ino = get_hidraw(hid_skel->links.hid_set_get_bits);
+	if (!ASSERT_GE(hidraw_ino, 0, "get_hidraw"))
+		goto cleanup;
+
+	/* open hidraw node to check the other side of the pipe */
+	sprintf(hidraw_path, "/dev/hidraw%d", hidraw_ino);
+	hidraw_fd = open(hidraw_path, O_RDWR | O_NONBLOCK);
+
+	if (!ASSERT_GE(hidraw_fd, 0, "open_hidraw"))
+		goto cleanup;
+
+	/* inject one event */
+	buf[0] = 1;
+	buf[1] = 42;
+	send_event(uhid_fd, buf, 6);
+
+	/* read the data from hidraw */
+	memset(buf, 0, sizeof(buf));
+	err = read(hidraw_fd, buf, sizeof(buf));
+	if (!ASSERT_EQ(err, 6, "read_hidraw"))
+		goto cleanup;
+
+	if (!ASSERT_EQ(buf[2], (42 >> 2), "hid_set_get_bits"))
+		goto cleanup;
+
+	ret = 0;
+
+cleanup:
+	if (hidraw_fd >= 0)
+		close(hidraw_fd);
+
+	hid__detach(hid_skel);
+
+	return ret;
+}
+
 /*
  * Attach hid_rdesc_fixup to the given uhid device,
  * retrieve and open the matching hidraw node,
@@ -641,6 +697,9 @@  void serial_test_hid_bpf(void)
 	err = test_hid_user_call(hid_skel, uhid_fd, sysfs_fd);
 	ASSERT_OK(err, "hid_user");
 
+	err = test_hid_set_get_bits(hid_skel, uhid_fd, sysfs_fd);
+	ASSERT_OK(err, "hid_set_get_data");
+
 	/*
 	 * this test should be run last because we disconnect/reconnect
 	 * the device, meaning that it changes the overall uhid device
diff --git a/tools/testing/selftests/bpf/progs/hid.c b/tools/testing/selftests/bpf/progs/hid.c
index fbdbe9d1b605..d57571b9af9a 100644
--- a/tools/testing/selftests/bpf/progs/hid.c
+++ b/tools/testing/selftests/bpf/progs/hid.c
@@ -143,3 +143,22 @@  int hid_user(struct hid_bpf_ctx *ctx)
 
 	return 0;
 }
+
+SEC("hid/device_event")
+int hid_set_get_bits(struct hid_bpf_ctx *ctx)
+{
+	int ret;
+	__u32 data = 0;
+
+	/* extract data at bit offset 10 of size 4 (half a byte) */
+	ret = bpf_hid_get_bits(ctx, 10, 4, &data);
+	if (ret < 0)
+		return ret;
+
+	/* reinject it */
+	ret = bpf_hid_set_bits(ctx, 16, 4, data);
+	if (ret < 0)
+		return ret;
+
+	return 0;
+}