@@ -163,6 +163,11 @@ MODULE_PARM_DESC(debug, "Debug level (0-1)");
#define DBLV_X6 0x10 /* clock x6 */
#define DBLV_X8 0x11 /* clock x8 */
+#define REG_SCALING_XSC 0x70 /* Test pattern and horizontal scale factor */
+#define TEST_PATTTERN_0 0x80
+#define REG_SCALING_YSC 0x71 /* Test pattern and vertical scale factor */
+#define TEST_PATTTERN_1 0x80
+
#define REG_REG76 0x76 /* OV's name */
#define R76_BLKPCOR 0x80 /* Black pixel correction enable */
#define R76_WHTPCOR 0x40 /* White pixel correction enable */
@@ -292,7 +297,8 @@ static struct regval_list ov7670_default_regs[] = {
{ REG_COM3, 0 }, { REG_COM14, 0 },
/* Mystery scaling numbers */
- { 0x70, 0x3a }, { 0x71, 0x35 },
+ { REG_SCALING_XSC, 0x3a },
+ { REG_SCALING_YSC, 0x35 },
{ 0x72, 0x11 }, { 0x73, 0xf0 },
{ 0xa2, 0x02 }, { REG_COM10, 0x0 },
@@ -568,6 +574,19 @@ static int ov7670_write(struct v4l2_subdev *sd, unsigned char reg,
return ov7670_write_i2c(sd, reg, value);
}
+static int ov7670_update_bits(struct v4l2_subdev *sd, unsigned char reg,
+ unsigned char mask, unsigned char value)
+{
+ unsigned char orig;
+ int ret;
+
+ ret = ov7670_read(sd, reg, &orig);
+ if (ret)
+ return ret;
+
+ return ov7670_write(sd, reg, (orig & ~mask) | (value & mask));
+}
+
/*
* Write a list of register settings; ff/ff stops the process.
*/
@@ -1470,6 +1489,25 @@ static int ov7670_s_autoexp(struct v4l2_subdev *sd,
return ret;
}
+static const char * const ov7670_test_pattern_menu[] = {
+ "No test output",
+ "Shifting \"1\"",
+ "8-bar color bar",
+ "Fade to gray color bar",
+};
+
+static int ov7670_s_test_pattern(struct v4l2_subdev *sd, int value)
+{
+ int ret;
+
+ ret = ov7670_update_bits(sd, REG_SCALING_XSC, TEST_PATTTERN_0,
+ value & BIT(0) ? TEST_PATTTERN_0 : 0);
+ if (ret)
+ return ret;
+
+ return ov7670_update_bits(sd, REG_SCALING_YSC, TEST_PATTTERN_1,
+ value & BIT(1) ? TEST_PATTTERN_1 : 0);
+}
static int ov7670_g_volatile_ctrl(struct v4l2_ctrl *ctrl)
{
@@ -1516,6 +1554,8 @@ static int ov7670_s_ctrl(struct v4l2_ctrl *ctrl)
return ov7670_s_exp(sd, info->exposure->val);
}
return ov7670_s_autoexp(sd, ctrl->val);
+ case V4L2_CID_TEST_PATTERN:
+ return ov7670_s_test_pattern(sd, ctrl->val);
}
return -EINVAL;
}
@@ -1770,6 +1810,10 @@ static int ov7670_probe(struct i2c_client *client,
info->auto_exposure = v4l2_ctrl_new_std_menu(&info->hdl, &ov7670_ctrl_ops,
V4L2_CID_EXPOSURE_AUTO, V4L2_EXPOSURE_MANUAL, 0,
V4L2_EXPOSURE_AUTO);
+ v4l2_ctrl_new_std_menu_items(&info->hdl, &ov7670_ctrl_ops,
+ V4L2_CID_TEST_PATTERN,
+ ARRAY_SIZE(ov7670_test_pattern_menu) - 1, 0, 0,
+ ov7670_test_pattern_menu);
sd->ctrl_handler = &info->hdl;
if (info->hdl.error) {
ret = info->hdl.error;
The ov7670 has the test pattern generator features. This makes use of it through V4L2_CID_TEST_PATTERN control. Cc: Jonathan Corbet <corbet@lwn.net> Cc: Sakari Ailus <sakari.ailus@linux.intel.com> Cc: Mauro Carvalho Chehab <mchehab@s-opensource.com> Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> --- drivers/media/i2c/ov7670.c | 46 +++++++++++++++++++++++++++++++++++++++++++++- 1 file changed, 45 insertions(+), 1 deletion(-)