| Message ID | 20240411231954.62156-1-edliaw@google.com (mailing list archive) |
|---|---|
| State | New |
| Headers | show |
| Series | selftests/harness: remove use of LINE_MAX | expand |
On Thu, 11 Apr 2024 23:19:49 +0000 Edward Liaw <edliaw@google.com> wrote: > Android was seeing a compliation error because its C library does not > define LINE_MAX. This replaces the use of LINE_MAX / snprintf with > asprintf, which will change the behavior to not truncate the test name > if it is over 2048 chars long. Thanks, I'll grab and shall send it Linuswards for 6.9-rcX. I added Fixes: 38c957f07038 ("selftests: kselftest_harness: generate test name once")
On Thu, Apr 11, 2024 at 4:34 PM Andrew Morton <akpm@linux-foundation.org> wrote: > > Thanks, I'll grab and shall send it Linuswards for 6.9-rcX. > > I added > > Fixes: 38c957f07038 ("selftests: kselftest_harness: generate test name once") > Thanks, I just realized I forgot to remove the <limits.h> includes. Should I send another patch for that or send a v2 of this one?
On Fri, 12 Apr 2024 12:30:15 -0700 Edward Liaw <edliaw@google.com> wrote: > On Thu, Apr 11, 2024 at 4:34 PM Andrew Morton <akpm@linux-foundation.org> wrote: > > > > Thanks, I'll grab and shall send it Linuswards for 6.9-rcX. > > > > I added > > > > Fixes: 38c957f07038 ("selftests: kselftest_harness: generate test name once") > > > > Thanks, I just realized I forgot to remove the <limits.h> includes. > Should I send another patch for that or send a v2 of this one? I fixed it up, thanks.
diff --git a/tools/testing/selftests/kselftest_harness.h b/tools/testing/selftests/kselftest_harness.h index 4fd735e48ee7..70fedd2411ed 100644 --- a/tools/testing/selftests/kselftest_harness.h +++ b/tools/testing/selftests/kselftest_harness.h @@ -1156,7 +1156,7 @@ void __run_test(struct __fixture_metadata *f, struct __test_metadata *t) { struct __test_xfail *xfail; - char test_name[LINE_MAX]; + char *test_name; const char *diagnostic; /* reset test struct */ @@ -1164,8 +1164,8 @@ void __run_test(struct __fixture_metadata *f, t->trigger = 0; memset(t->results->reason, 0, sizeof(t->results->reason)); - snprintf(test_name, sizeof(test_name), "%s%s%s.%s", - f->name, variant->name[0] ? "." : "", variant->name, t->name); + asprintf(&test_name, "%s%s%s.%s", f->name, + variant->name[0] ? "." : "", variant->name, t->name); ksft_print_msg(" RUN %s ...\n", test_name); @@ -1203,6 +1203,7 @@ void __run_test(struct __fixture_metadata *f, ksft_test_result_code(t->exit_code, test_name, diagnostic ? "%s" : "", diagnostic); + free(test_name); } static int test_harness_run(int argc, char **argv)
Android was seeing a compliation error because its C library does not define LINE_MAX. This replaces the use of LINE_MAX / snprintf with asprintf, which will change the behavior to not truncate the test name if it is over 2048 chars long. See also: https://github.com/llvm/llvm-project/issues/88119 Signed-off-by: Edward Liaw <edliaw@google.com> --- tools/testing/selftests/kselftest_harness.h | 7 ++++--- 1 file changed, 4 insertions(+), 3 deletions(-)