@@ -1527,9 +1527,6 @@ static void nfit_test1_setup(struct nfit_test *t)
set_bit(ND_CMD_ARS_START, &acpi_desc->bus_cmd_force_en);
set_bit(ND_CMD_ARS_STATUS, &acpi_desc->bus_cmd_force_en);
set_bit(ND_CMD_CLEAR_ERROR, &acpi_desc->bus_cmd_force_en);
- set_bit(ND_CMD_GET_CONFIG_SIZE, &acpi_desc->dimm_cmd_force_en);
- set_bit(ND_CMD_GET_CONFIG_DATA, &acpi_desc->dimm_cmd_force_en);
- set_bit(ND_CMD_SET_CONFIG_DATA, &acpi_desc->dimm_cmd_force_en);
}
static int nfit_test_blk_do_io(struct nd_blk_region *ndbr, resource_size_t dpa,
Improve coverage of NVDIMM-N test scenarios by providing a test bus incapable of label operations. Signed-off-by: Dan Williams <dan.j.williams@intel.com> --- tools/testing/nvdimm/test/nfit.c | 3 --- 1 file changed, 3 deletions(-)