@@ -82,7 +82,7 @@
#define EXYNOS_TRIMINFO_RELOAD 0x1
#define EXYNOS_TMU_CLEAR_RISE_INT 0x111
-#define EXYNOS_TMU_CLEAR_FALL_INT (0x111 << 16)
+#define EXYNOS_TMU_CLEAR_FALL_INT (0x111 << 12)
#define EXYNOS_MUX_ADDR_VALUE 6
#define EXYNOS_MUX_ADDR_SHIFT 20
#define EXYNOS_TMU_TRIP_MODE_SHIFT 13
@@ -373,7 +373,14 @@ static int exynos_get_temp(struct thermal_zone_device *thermal,
static int exynos_get_trend(struct thermal_zone_device *thermal,
int trip, enum thermal_trend *trend)
{
- if (thermal->temperature >= trip)
+ int ret;
+ unsigned long trip_temp;
+
+ ret = exynos_get_trip_temp(thermal, trip, &trip_temp);
+ if (ret < 0)
+ return ret;
+
+ if (thermal->temperature >= trip_temp)
*trend = THERMAL_TREND_RAISING;
else
*trend = THERMAL_TREND_DROPPING;
@@ -712,10 +719,9 @@ static void exynos_tmu_work(struct work_struct *work)
struct exynos_tmu_data *data = container_of(work,
struct exynos_tmu_data, irq_work);
+ exynos_report_trigger();
mutex_lock(&data->lock);
clk_enable(data->clk);
-
-
if (data->soc == SOC_ARCH_EXYNOS)
writel(EXYNOS_TMU_CLEAR_RISE_INT |
EXYNOS_TMU_CLEAR_FALL_INT,
@@ -723,10 +729,9 @@ static void exynos_tmu_work(struct work_struct *work)
else
writel(EXYNOS4210_TMU_INTCLEAR_VAL,
data->base + EXYNOS_TMU_REG_INTCLEAR);
-
clk_disable(data->clk);
mutex_unlock(&data->lock);
- exynos_report_trigger();
+
enable_irq(data->irq);
}
Below fixes are done to support falling threshold interrupt, * Falling interrupt status macro corrected according to exynos5 data sheet. * The get trend function modified to calculate trip temperature correctly. * The clearing of interrupt status in the isr is now done after handling the event that caused the interrupt. Signed-off-by: Amit Daniel Kachhap <amit.daniel@samsung.com> --- Changes since V2, Incorporated Joe Perches <joe@perches.com> review comments about coding guidelines. This path is based on thermal maintainer next tree. drivers/thermal/exynos_thermal.c | 17 +++++++++++------ 1 files changed, 11 insertions(+), 6 deletions(-)